The ITP Star Styli SCM3S3005020/180° is a precision star-style probe designed for metrology professionals who need reliable long-reach measurements. With a silicon nitride ball and a compact M3 XXT mounting thread, it excels at capturing large diameters, deep bores, undercuts, and threaded features without bending or loss of accuracy.

• Ball material: Silicon nitride ball for exceptional hardness, wear resistance, and long-term stability in demanding measuring tasks
• Mounting thread: M3 XXT thread for secure, quick attachment to standard CMM probes
• Measuring length: 11 mm for extended reach while maintaining rigidity and accuracy
• Access design: 180° two-ended geometry that enables measurement around challenging features from multiple directions
• Star stylus advantage: Proven geometry minimizes deflection on long gauging lengths, ideal for large-diameter workpieces and deep features

This stylus is tailored for applications where accuracy matters over extended gauges: measuring large diameters, threads, and undercuts without compromising tip integrity. The two-ended, 180° design provides flexibility in reach, while the silicon nitride sphere delivers repeatable contact and reduced wear across repetitive scans. Ideal for integration into existing metrology workflows that rely on robust, task-specific probing configurations.